The Evaluation of E-k Curves from Tunneling Currents

Author: McGill, Thomas Conley, Jr.

Year: 1969

Degree: Dissertation (Ph.D.)

Advisor: Mead, Carver

Committee Member: Unknown, Unknown

Option: Electrical Engineering; Chemistry; Physics

DOI: 10.7907/D3BX-RQ47

Abstract

The basis for interpreting I-V data taken on metal-insulator-metal structures with insulator thicknesses of less than 100 Å is examined carefully. A set of experimental tests for determining the applicability of the equation linking the I-V data to the E-k curve is presented. These tests are found to be a stringent requirement on the experimental data and to support strongly the interpretation of the experimental I-V in terms of the E-k curve for the insulator. A numerical technique for obtaining the E-k curve from I-V data is presented, and applied to data taken on Al-AlN-(Mg,Au) structures where it allows the evaluation of the E-k curve for AlN throughout the forbidden gap.

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