Number of items:
1
.
Westmoreland, James Edward, III
(1971)
Channeling Effect Analysis of Lattice Disorder in Boron Implanted Silicon.
Dissertation (Ph.D.), California Institute of Technology.
doi:10.7907/K38Q-NC50.
https://resolver.caltech.edu/CaltechTHESIS:08242017-130415823
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